COLON 发表于 2025-3-25 05:32:41
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Andres Folleco,Taghi M. Khoshgoftaar,Jason Van Hulse同时发生 发表于 2025-3-25 15:10:15
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Central Limit Theorem for a Family of Reliability Measuresduced in an earlier paper. This measure is derived from a marked point process where the base process is a random point process and the marks are fuzzy random variables. The underlying point process represents the locations where faults are located and the fuzzy marks quantify the subjective assessmClimate 发表于 2025-3-25 23:11:22
On Weighted Least Squares Estimation for the Parameters of Weibull Distributiondeling the phenomena of fatigue and life of many devices such as ball bearings, electric bulbs, capacitors, transistors, motors and automotive radiators. In recent years, a number of modifications of the traditional Weibull distribution have been proposed and applied to model complex failure data sehypnotic 发表于 2025-3-26 01:04:50
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Some Alternative Approaches to System Reliability Modelingst decade. Part of the presented material is published for the first time. Another part which has already appeared or will appear in the coming months, now is presented in a newer, “simpler” way, as our teaching experience on that has grown during many professional discussions.configuration 发表于 2025-3-26 11:30:12
The Optimal Burn-in: State of the Art and New Advances for Cost Function Formulationthe earlier failures of the products, burn-in testing has been widely used in electronic manufacturing as well as many other areas such as the military and aerospace industries since the 1950s. Burn-in has proven to be a very effective quality control procedure which can improve products’ quality, eNomadic 发表于 2025-3-26 13:07:58
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Weibull Data Analysis with Few or no Failuresin the reliability development phase. A good lab test will shorten the product development cycles and minimizes cost and part failures at the PG or field testing before the vehicle volume production. Appropriate testing is available to correlate test time in the lab (or lab test bogey) to the real w