Radiation
发表于 2025-3-23 09:54:00
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noxious
发表于 2025-3-23 14:27:36
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Tortuous
发表于 2025-3-23 21:08:50
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流浪
发表于 2025-3-24 01:14:21
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万花筒
发表于 2025-3-24 03:21:41
Introduction to VLSI Testing,ich the circuit is used. However, in some applications where the replacement cost is high or the consequences of failure are serious, highly reliable devices of high quality are needed. Examples of such uses are in satellites, undersea cable, remote stations, manned space vehicles and for military systems.
平
发表于 2025-3-24 07:12:20
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Mundane
发表于 2025-3-24 10:51:48
Assessment of the Tests as Predictors of Failure,In this section we will illustrate the usefulness of the devised tests by referring to the behavior of the devices subject to thermal and electrical stress. Before we discuss this in detail in the next few subsections we first of all introduce the experimental details for reference.
Derogate
发表于 2025-3-24 18:11:12
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PANG
发表于 2025-3-24 22:59:58
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craven
发表于 2025-3-25 01:11:58
The Devices Studied and their Simulation,cuit simulation package, PSPICE (Microsim Corporation), which i3 a version written for use on the IBM personal computer. The simulations gave the size and shape of the waveforms occuring in the circuits being studied and the effect of different conditions within the circuit on these waveforms.