遮阳伞
发表于 2025-3-21 19:37:07
书目名称Radiation Effects on Integrated Circuits and Systems for Space Applications影响因子(影响力)<br> http://impactfactor.cn/if/?ISSN=BK0820435<br><br> <br><br>书目名称Radiation Effects on Integrated Circuits and Systems for Space Applications影响因子(影响力)学科排名<br> http://impactfactor.cn/ifr/?ISSN=BK0820435<br><br> <br><br>书目名称Radiation Effects on Integrated Circuits and Systems for Space Applications网络公开度<br> http://impactfactor.cn/at/?ISSN=BK0820435<br><br> <br><br>书目名称Radiation Effects on Integrated Circuits and Systems for Space Applications网络公开度学科排名<br> http://impactfactor.cn/atr/?ISSN=BK0820435<br><br> <br><br>书目名称Radiation Effects on Integrated Circuits and Systems for Space Applications被引频次<br> http://impactfactor.cn/tc/?ISSN=BK0820435<br><br> <br><br>书目名称Radiation Effects on Integrated Circuits and Systems for Space Applications被引频次学科排名<br> http://impactfactor.cn/tcr/?ISSN=BK0820435<br><br> <br><br>书目名称Radiation Effects on Integrated Circuits and Systems for Space Applications年度引用<br> http://impactfactor.cn/ii/?ISSN=BK0820435<br><br> <br><br>书目名称Radiation Effects on Integrated Circuits and Systems for Space Applications年度引用学科排名<br> http://impactfactor.cn/iir/?ISSN=BK0820435<br><br> <br><br>书目名称Radiation Effects on Integrated Circuits and Systems for Space Applications读者反馈<br> http://impactfactor.cn/5y/?ISSN=BK0820435<br><br> <br><br>书目名称Radiation Effects on Integrated Circuits and Systems for Space Applications读者反馈学科排名<br> http://impactfactor.cn/5yr/?ISSN=BK0820435<br><br> <br><br>
Palate
发表于 2025-3-21 21:09:27
Single-Event Effects Test Methods,dations for choosing test patterns during testing; advantages and disadvantages of static and dynamic testing; impact of total ionizing dose effects on test results; specifics of testing for destructive types of SEEs and others. Recommendations for choosing the SEE test algorithms are summarized.
CLAM
发表于 2025-3-22 03:16:45
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HOWL
发表于 2025-3-22 06:37:50
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遍及
发表于 2025-3-22 12:12:55
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scoliosis
发表于 2025-3-22 16:35:27
System-Level Modeling and Analysis of the Vulnerability of a Processor to Single-Event Upsets (SEUsodel of the processor is formalized as a Continuous-Time Markov Chain (CTMC). Probabilistic model checking (PMC) is utilized to exhaustively estimate the impact of SEUs on the behavior of the processor. The proposed CTMC model is analyzed for different SEU injection scenarios and different bit-flip
Habituate
发表于 2025-3-22 19:44:06
Single-Event Effects Test Methods, to SEE and existing standards and guidelines for testing with the use of heavy ion and proton accelerators. Basic requirements for both heavy ion and proton testing will be considered in detail including requirements for the energy of ions, their linear energy transfer (LET) and the range in semico
吝啬性
发表于 2025-3-23 00:55:57
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debunk
发表于 2025-3-23 02:36:48
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和蔼
发表于 2025-3-23 06:43:57
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