Collision
发表于 2025-3-25 04:41:46
Charlotte Rehm,Benedikt Klauser,Jörg S. Hartigality and electron transfer through chiral systems; by Spiros Skourtis and David Beratan .*.Chiral-selective surface chemistry induced by spin-polarized secondary electrons; by Richard Rosenberg.978-3-642-26698-0978-3-642-18104-7Series ISSN 0340-1022 Series E-ISSN 1436-5049
Guaff豪情痛饮
发表于 2025-3-25 08:32:29
http://reply.papertrans.cn/83/8202/820191/820191_22.png
显示
发表于 2025-3-25 11:48:14
http://reply.papertrans.cn/83/8202/820191/820191_23.png
antiandrogen
发表于 2025-3-25 17:16:57
http://reply.papertrans.cn/83/8202/820191/820191_24.png
漫不经心
发表于 2025-3-25 23:00:59
http://reply.papertrans.cn/83/8202/820191/820191_25.png
assent
发表于 2025-3-26 00:29:14
http://reply.papertrans.cn/83/8202/820191/820191_26.png
设施
发表于 2025-3-26 05:17:33
Geunu Bak,Jee Soo Choi,Wonkyeong Kim,Shinae Suk,Younghoon Leeality and electron transfer through chiral systems; by Spiros Skourtis and David Beratan .*.Chiral-selective surface chemistry induced by spin-polarized secondary electrons; by Richard Rosenberg.978-3-642-26698-0978-3-642-18104-7Series ISSN 0340-1022 Series E-ISSN 1436-5049
monopoly
发表于 2025-3-26 11:20:34
ality and electron transfer through chiral systems; by Spiros Skourtis and David Beratan .*.Chiral-selective surface chemistry induced by spin-polarized secondary electrons; by Richard Rosenberg.978-3-642-26698-0978-3-642-18104-7Series ISSN 0340-1022 Series E-ISSN 1436-5049
保守党
发表于 2025-3-26 14:27:29
Colleen A. Kellenberger,Zachary F. Hallberg,Ming C. Hammondith strong correlations or topology leads to complex and novel behavior that can be exploited to create the next generation of spin electronics and quantum computing devices.978-3-030-07898-0978-3-319-89938-1Series ISSN 2190-5053 Series E-ISSN 2190-5061
Debility
发表于 2025-3-26 19:33:30
ZJU_China Team (iGEM 2012),Ming Chenith strong correlations or topology leads to complex and novel behavior that can be exploited to create the next generation of spin electronics and quantum computing devices.978-3-030-07898-0978-3-319-89938-1Series ISSN 2190-5053 Series E-ISSN 2190-5061