粘土
发表于 2025-3-23 11:36:50
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debris
发表于 2025-3-23 16:01:59
to the Fermi surface and are indeed weakly interacting. Instead of trying to calculate their residual interactions microscopically, which would be a very difficult task, the interactions are parametrized. These parameters enter the expressions for different physical quantities and therefore can be d
medium
发表于 2025-3-23 19:14:04
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A精确的
发表于 2025-3-24 00:37:05
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fidelity
发表于 2025-3-24 06:25:48
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无脊椎
发表于 2025-3-24 07:20:46
Keith A. Jenkinsear future. This progress clearly shows that the contribution of electron crystallography is quite unique, as it enables to reveal the intimate structure of samples with high accuracy but on much smaller samples than have ever been investigated by X-ray diffraction. As a tribute to these tremendous
Orgasm
发表于 2025-3-24 12:21:57
Keith A. Jenkinsbonding in order to establish a relation between atomic structure and properties. This includes also modification of the methods for structure analysis (automatic indexing, direct methods, measurement at low and high temperatures) and its application for solving more complex structure, e.g. metal-or
畏缩
发表于 2025-3-24 17:41:24
ear future. This progress clearly shows that the contribution of electron crystallography is quite unique, as it enables to reveal the intimate structure of samples with high accuracy but on much smaller samples than have ever been investigated by X-ray diffraction. As a tribute to these tremendous
湿润
发表于 2025-3-24 22:37:12
ble. In addition to abstract concepts, the reader will learn of practical tips required to achieve meaningful measurements, and will understandthe relationship between these measurements and traditional, conventional DC characteristics. .978-3-030-77777-7978-3-030-77775-3
Infect
发表于 2025-3-25 02:19:32
Keith A. Jenkinsis quite unique, as it enables to reveal the intimate structure of samples with high accuracy but on much smaller samples than have ever been investigated by X-ray diffraction. As a tribute to these tremendous 978-1-4020-3919-5978-1-4020-3920-1Series ISSN 1568-2609