顽固 发表于 2025-3-25 06:27:49
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J-P. Antoine,S. Twareque Ali,A. Odzijewiczexperimental works we performed on III-V MOSFETs using ex-situ atomic-layer-deposited high-k dielectrics and also reported works in the literature using in-situ molecular beam expitaxy grown Ga.O.(Gd.O.) as gate dielectric. The results show that physics related to III-V substrates is as important as