群居动物 发表于 2025-3-25 04:30:20

Statistical Blockade: Estimating Rare Event Statistics,cal, but due to manufacturing variations, they usually differ. Suppose we desire a . yield of 99%; that is, no more that one chip per 100 should fail. This means that on average, not more than (approx.) one per 100×1 million SRAM cells; that is 10 per billion, should fail. This translates to a requi

无聊的人 发表于 2025-3-25 08:55:51

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自恋 发表于 2025-3-25 13:19:18

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简洁 发表于 2025-3-25 17:25:52

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洞察力 发表于 2025-3-25 20:08:54

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DUCE 发表于 2025-3-26 03:55:52

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ligature 发表于 2025-3-26 04:48:37

Amith Singhee,Rob A. RutenbarPresents flexible and general techniques for statistical analysis that can be applied to wide variety of circuit applications.Applies theory from a wide variety of scientific fields (machine learning,

动脉 发表于 2025-3-26 12:10:02

Book 2009hine learning and actuarial risk, and synthesizes them with innovative attacks for the problem domain of integrated circuits. The result is a set of novel solutions to problems of efficient statistical analysis of circuits in the nanometer regime..

难管 发表于 2025-3-26 14:04:02

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严厉批评 发表于 2025-3-26 18:46:29

Book 2009 the circuit performance. Traditional CAD tools are not well-equipped to handle this scenario, since they do not model this statistical nature of the circuit parameters and performances, or if they do, the existing techniques tend to be over-simplified or intractably slow. Novel Algorithms for Fast
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查看完整版本: Titlebook: Novel Algorithms for Fast Statistical Analysis of Scaled Circuits; Amith Singhee,Rob A. Rutenbar Book 2009 Springer Science+Business Media