群居动物 发表于 2025-3-25 04:30:20
Statistical Blockade: Estimating Rare Event Statistics,cal, but due to manufacturing variations, they usually differ. Suppose we desire a . yield of 99%; that is, no more that one chip per 100 should fail. This means that on average, not more than (approx.) one per 100×1 million SRAM cells; that is 10 per billion, should fail. This translates to a requi无聊的人 发表于 2025-3-25 08:55:51
http://reply.papertrans.cn/67/6684/668339/668339_22.png自恋 发表于 2025-3-25 13:19:18
http://reply.papertrans.cn/67/6684/668339/668339_23.png简洁 发表于 2025-3-25 17:25:52
http://reply.papertrans.cn/67/6684/668339/668339_24.png洞察力 发表于 2025-3-25 20:08:54
http://reply.papertrans.cn/67/6684/668339/668339_25.pngDUCE 发表于 2025-3-26 03:55:52
http://reply.papertrans.cn/67/6684/668339/668339_26.pngligature 发表于 2025-3-26 04:48:37
Amith Singhee,Rob A. RutenbarPresents flexible and general techniques for statistical analysis that can be applied to wide variety of circuit applications.Applies theory from a wide variety of scientific fields (machine learning,动脉 发表于 2025-3-26 12:10:02
Book 2009hine learning and actuarial risk, and synthesizes them with innovative attacks for the problem domain of integrated circuits. The result is a set of novel solutions to problems of efficient statistical analysis of circuits in the nanometer regime..难管 发表于 2025-3-26 14:04:02
http://reply.papertrans.cn/67/6684/668339/668339_29.png严厉批评 发表于 2025-3-26 18:46:29
Book 2009 the circuit performance. Traditional CAD tools are not well-equipped to handle this scenario, since they do not model this statistical nature of the circuit parameters and performances, or if they do, the existing techniques tend to be over-simplified or intractably slow. Novel Algorithms for Fast