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Basic Mechanisms for Single Atom Manipulation in Semiconductor Systems with the FM-AFM,
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Frequency Modulation Atomic Force Microscopy in Liquids,
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1434-4904practical tools for characterization and manipulation of individual atoms/molecules and nanostructures with atomic/subatomic resolution. Therefore, the book exemplifies how NC-AFM has become a crucial tool for the expanding fields of nanoscience and nanotechnology..978-3-642-26070-4978-3-642-01495-6Series ISSN 1434-4904 Series E-ISSN 2197-7127
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Seizo Morita,Franz J. Giessibl,Roland WiesendangerMost advanced state-of-the-art report on scanning probe microscopy.Presents the latest developments in STM and AFM.Deals with the various classes of materials studied.A valuable reference work for res
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978-3-642-26070-4Springer-Verlag Berlin Heidelberg 2009