强烈的愿望 发表于 2025-3-21 17:01:46

书目名称Noise Contamination in Nanoscale VLSI Circuits影响因子(影响力)<br>        http://impactfactor.cn/2024/if/?ISSN=BK0666770<br><br>        <br><br>书目名称Noise Contamination in Nanoscale VLSI Circuits影响因子(影响力)学科排名<br>        http://impactfactor.cn/2024/ifr/?ISSN=BK0666770<br><br>        <br><br>书目名称Noise Contamination in Nanoscale VLSI Circuits网络公开度<br>        http://impactfactor.cn/2024/at/?ISSN=BK0666770<br><br>        <br><br>书目名称Noise Contamination in Nanoscale VLSI Circuits网络公开度学科排名<br>        http://impactfactor.cn/2024/atr/?ISSN=BK0666770<br><br>        <br><br>书目名称Noise Contamination in Nanoscale VLSI Circuits被引频次<br>        http://impactfactor.cn/2024/tc/?ISSN=BK0666770<br><br>        <br><br>书目名称Noise Contamination in Nanoscale VLSI Circuits被引频次学科排名<br>        http://impactfactor.cn/2024/tcr/?ISSN=BK0666770<br><br>        <br><br>书目名称Noise Contamination in Nanoscale VLSI Circuits年度引用<br>        http://impactfactor.cn/2024/ii/?ISSN=BK0666770<br><br>        <br><br>书目名称Noise Contamination in Nanoscale VLSI Circuits年度引用学科排名<br>        http://impactfactor.cn/2024/iir/?ISSN=BK0666770<br><br>        <br><br>书目名称Noise Contamination in Nanoscale VLSI Circuits读者反馈<br>        http://impactfactor.cn/2024/5y/?ISSN=BK0666770<br><br>        <br><br>书目名称Noise Contamination in Nanoscale VLSI Circuits读者反馈学科排名<br>        http://impactfactor.cn/2024/5yr/?ISSN=BK0666770<br><br>        <br><br>

Lobotomy 发表于 2025-3-21 21:46:23

http://reply.papertrans.cn/67/6668/666770/666770_2.png

运动性 发表于 2025-3-22 00:55:22

http://reply.papertrans.cn/67/6668/666770/666770_3.png

Obligatory 发表于 2025-3-22 07:59:03

http://reply.papertrans.cn/67/6668/666770/666770_4.png

朝圣者 发表于 2025-3-22 12:01:44

http://reply.papertrans.cn/67/6668/666770/666770_5.png

重叠 发表于 2025-3-22 15:34:10

http://reply.papertrans.cn/67/6668/666770/666770_6.png

Assignment 发表于 2025-3-22 20:54:27

Thermal Noise, also emerged as a major design concern for high-performance integrated circuits for the future technology nodes as it significantly affects the performance of a chip. The increased temperature affects both interconnect resistance and driving strength of buffers. Since the driving strengths of the c

Parallel 发表于 2025-3-23 01:03:41

http://reply.papertrans.cn/67/6668/666770/666770_8.png

arcane 发表于 2025-3-23 01:52:15

http://reply.papertrans.cn/67/6668/666770/666770_9.png

correspondent 发表于 2025-3-23 05:47:20

http://reply.papertrans.cn/67/6668/666770/666770_10.png
页: [1] 2 3 4 5
查看完整版本: Titlebook: Noise Contamination in Nanoscale VLSI Circuits; Selahattin Sayil Textbook 2022 The Editor(s) (if applicable) and The Author(s), under excl