HABIT
发表于 2025-3-21 17:36:49
书目名称Nanoscale Phenomena in Ferroelectric Thin Films影响因子(影响力)<br> http://figure.impactfactor.cn/if/?ISSN=BK0660947<br><br> <br><br>书目名称Nanoscale Phenomena in Ferroelectric Thin Films影响因子(影响力)学科排名<br> http://figure.impactfactor.cn/ifr/?ISSN=BK0660947<br><br> <br><br>书目名称Nanoscale Phenomena in Ferroelectric Thin Films网络公开度<br> http://figure.impactfactor.cn/at/?ISSN=BK0660947<br><br> <br><br>书目名称Nanoscale Phenomena in Ferroelectric Thin Films网络公开度学科排名<br> http://figure.impactfactor.cn/atr/?ISSN=BK0660947<br><br> <br><br>书目名称Nanoscale Phenomena in Ferroelectric Thin Films被引频次<br> http://figure.impactfactor.cn/tc/?ISSN=BK0660947<br><br> <br><br>书目名称Nanoscale Phenomena in Ferroelectric Thin Films被引频次学科排名<br> http://figure.impactfactor.cn/tcr/?ISSN=BK0660947<br><br> <br><br>书目名称Nanoscale Phenomena in Ferroelectric Thin Films年度引用<br> http://figure.impactfactor.cn/ii/?ISSN=BK0660947<br><br> <br><br>书目名称Nanoscale Phenomena in Ferroelectric Thin Films年度引用学科排名<br> http://figure.impactfactor.cn/iir/?ISSN=BK0660947<br><br> <br><br>书目名称Nanoscale Phenomena in Ferroelectric Thin Films读者反馈<br> http://figure.impactfactor.cn/5y/?ISSN=BK0660947<br><br> <br><br>书目名称Nanoscale Phenomena in Ferroelectric Thin Films读者反馈学科排名<br> http://figure.impactfactor.cn/5yr/?ISSN=BK0660947<br><br> <br><br>
同音
发表于 2025-3-21 22:01:35
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savage
发表于 2025-3-22 02:41:11
Ferroelectric Thin Films for Memory Applications: Nanoscale Characterization by Scanning Force Microapacitor variability of switching parameters has been used to predict the grain size limit to sustain a required level of performance reliability of memory devices. Special attention is given to investigation of the microscopic mechanisms of polarization decay (retention loss) and dielectric breakdown.
Regurgitation
发表于 2025-3-22 08:20:02
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d-limonene
发表于 2025-3-22 09:27:43
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triptans
发表于 2025-3-22 12:57:42
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lymphoma
发表于 2025-3-22 20:12:48
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Yourself
发表于 2025-3-22 21:43:21
Nanoscale Investigation of MOCVD- Pb(Zr,Ti)O3 Thin Films Using Scanning Probe Microscopyation switching processes in epitaxial PZT thin films and capacitors. They are investigated using atomic force microscopy (AFM), transmission electron microscopy (TEM), conductive AFM and piezoresponse scanning force microscopy (PFM).
最低点
发表于 2025-3-23 02:38:05
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感情脆弱
发表于 2025-3-23 06:31:48
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