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Donald B. Hayden,Neil R. Baker,Michael P. Percivalests are applied and in some cases low-frequency tests to ensure analog/RF functionality are exercised as well. Final test consists of checking device978-1-4419-4285-2978-0-387-46547-0Series ISSN 0929-1296
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Recent Advances in High-Voltage GaN MOS-Gated Transistors for Power Electronics Applications,
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The Political Economy of Transformation978-3-642-52404-2Series ISSN 1431-8806
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