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1389-2134 Overview: 978-1-4613-7374-2978-1-4615-5211-6Series ISSN 1389-2134一加就喷出 发表于 2025-3-22 04:35:15
Review of Microscale Thermometry Techniques, these techniques are applicable for both device and material characterization while others are suitable only for device thermometry. This chapter reviews thermometry techniques for microdevices and microstructures. The techniques are categorized depending on whether they employ electrical or optical signals.精致 发表于 2025-3-22 11:21:45
Thermal Properties of Amorphous Dielectric Films,m the basis of the techniques that measure the in- and out-of-plane thermal conductivity thermal conductivity and volumetric heat capacity heat capacity of thin dielectric films. The characterization capability is applied to the study of process-dependent thermal properties of silicon dioxide, which serves as a model amorphous solid.轻推 发表于 2025-3-22 12:52:56
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Y. Sungtaek Ju Ph.D.,Kenneth E. Goodson Ph.D.ließt damit Geld zu, das der Kapitalmarkt derzeit kaum bereitstellt, die anderen hoffen, durch die Unternehmenskooperation Innovationslücken schließen zu können. ..Markus Solf untersucht, ob das Modell "Finanzierung als Gegenleistung für zukünftige Forschungsergebnisse" eine Basis für langfristig erdebouch 发表于 2025-3-23 02:36:14
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