灌溉
发表于 2025-3-23 10:24:06
http://reply.papertrans.cn/64/6334/633318/633318_11.png
圆柱
发表于 2025-3-23 16:56:37
Book 2007 enough simply to keep abreast of the rest of the world in scientific matters. We 1 must maintain our leadership. President Harry Truman spoke those words in 1950, in the aftermath of World War II and in the midst of the Cold War. Indeed, the scientific and engineering leadership of the United State
Charlatan
发表于 2025-3-23 19:24:44
http://reply.papertrans.cn/64/6334/633318/633318_13.png
Allowance
发表于 2025-3-24 00:00:47
Business, Education, the Environment, and Other Issues,haracteristics in all of the countries visited drive and/or enable the technological development necessary for moving micromanufacturing forward. While this chapter makes some effort to compare the U.S. with other countries on these issues, readers can easily conduct similar comparisons from their own perspectives.
TRUST
发表于 2025-3-24 04:41:14
very large degree depends upon our sci- tific progress. Moreover, it is not enough simply to keep abreast of the rest of the world in scientific matters. We 1 must maintain our leadership. President Harry Truman spoke those words in 1950, in the aftermath of World War II and in the midst of the Cold
DOSE
发表于 2025-3-24 10:05:02
http://reply.papertrans.cn/64/6334/633318/633318_16.png
轿车
发表于 2025-3-24 14:39:03
http://reply.papertrans.cn/64/6334/633318/633318_17.png
Flinch
发表于 2025-3-24 16:12:00
Materials,le ability to be manufactured. These criteria hold true for micromanufacturing, in which parts have overall dimensions of less than 1 mm. This chapter begins by reviewing materials usage in Asian and European research in micromanufacturing, categorized by manufacturing process. Following that, speci
Limerick
发表于 2025-3-24 19:19:39
http://reply.papertrans.cn/64/6334/633318/633318_19.png
Blood-Clot
发表于 2025-3-24 23:19:06
Metrology, Sensors and Control,any of them are used for metrology, and in particular dimensional metrology. Most are used on production machines to provide feedback during production. Few metrology systems for process and product control are available. The sensors and metrology systems available for product and process analysis a