coherent 发表于 2025-3-21 17:33:49

书目名称Materials and Reliability Handbook for Semiconductor Optical and Electron Devices影响因子(影响力)<br>        http://impactfactor.cn/if/?ISSN=BK0625827<br><br>        <br><br>书目名称Materials and Reliability Handbook for Semiconductor Optical and Electron Devices影响因子(影响力)学科排名<br>        http://impactfactor.cn/ifr/?ISSN=BK0625827<br><br>        <br><br>书目名称Materials and Reliability Handbook for Semiconductor Optical and Electron Devices网络公开度<br>        http://impactfactor.cn/at/?ISSN=BK0625827<br><br>        <br><br>书目名称Materials and Reliability Handbook for Semiconductor Optical and Electron Devices网络公开度学科排名<br>        http://impactfactor.cn/atr/?ISSN=BK0625827<br><br>        <br><br>书目名称Materials and Reliability Handbook for Semiconductor Optical and Electron Devices被引频次<br>        http://impactfactor.cn/tc/?ISSN=BK0625827<br><br>        <br><br>书目名称Materials and Reliability Handbook for Semiconductor Optical and Electron Devices被引频次学科排名<br>        http://impactfactor.cn/tcr/?ISSN=BK0625827<br><br>        <br><br>书目名称Materials and Reliability Handbook for Semiconductor Optical and Electron Devices年度引用<br>        http://impactfactor.cn/ii/?ISSN=BK0625827<br><br>        <br><br>书目名称Materials and Reliability Handbook for Semiconductor Optical and Electron Devices年度引用学科排名<br>        http://impactfactor.cn/iir/?ISSN=BK0625827<br><br>        <br><br>书目名称Materials and Reliability Handbook for Semiconductor Optical and Electron Devices读者反馈<br>        http://impactfactor.cn/5y/?ISSN=BK0625827<br><br>        <br><br>书目名称Materials and Reliability Handbook for Semiconductor Optical and Electron Devices读者反馈学科排名<br>        http://impactfactor.cn/5yr/?ISSN=BK0625827<br><br>        <br><br>

山间窄路 发表于 2025-3-21 23:21:38

http://reply.papertrans.cn/63/6259/625827/625827_2.png

Albumin 发表于 2025-3-22 04:18:15

http://reply.papertrans.cn/63/6259/625827/625827_3.png

挑剔为人 发表于 2025-3-22 07:36:57

http://reply.papertrans.cn/63/6259/625827/625827_4.png

仇恨 发表于 2025-3-22 12:26:17

Failure Analysis Using Optical Evaluation Technique (OBIC) of LDs and APDs for Fiber Optical Communixtent of the degraded region is estimated by using relative OBIC intensity prior to aging. The use of OBIC incident sources at several wavelengths enables us to detect degradation in facets, epitaxial layers, and the device interior.

coddle 发表于 2025-3-22 14:57:45

http://reply.papertrans.cn/63/6259/625827/625827_6.png

Initiative 发表于 2025-3-22 17:16:51

http://reply.papertrans.cn/63/6259/625827/625827_7.png

珊瑚 发表于 2025-3-22 22:50:33

http://reply.papertrans.cn/63/6259/625827/625827_8.png

Pastry 发表于 2025-3-23 02:09:43

http://reply.papertrans.cn/63/6259/625827/625827_9.png

MUTE 发表于 2025-3-23 09:12:43

http://reply.papertrans.cn/63/6259/625827/625827_10.png
页: [1] 2 3 4 5 6
查看完整版本: Titlebook: Materials and Reliability Handbook for Semiconductor Optical and Electron Devices; Osamu Ueda,Stephen J. Pearton Book 2013 Springer Scienc