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hin each individual die. Parametric variability will be compounded by degradation in nanoscale integrated circuits resulting in instability of parameters over time, eventually leading to the development of faults. Process variation cannot be solved by improving manufacturing tolerances; variability

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ster transfer level (RTL) of design abstraction down to the synthesis or place-and-route levels of physical design. These techniques, tools, and methodologies are evolving everyday through the progression of de978-3-319-88286-4978-3-319-66619-8

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查看完整版本: Titlebook: Major Chemical and Petrochemical Companies of Europe 1989/90; R. M. Whiteside,J. Forsyth,A. Wilson Book 1989 Graham & Trotman Limited 1989