脾气好
发表于 2025-3-21 19:01:08
书目名称Machine Learning Support for Fault Diagnosis of System-on-Chip影响因子(影响力)<br> http://figure.impactfactor.cn/if/?ISSN=BK0620421<br><br> <br><br>书目名称Machine Learning Support for Fault Diagnosis of System-on-Chip影响因子(影响力)学科排名<br> http://figure.impactfactor.cn/ifr/?ISSN=BK0620421<br><br> <br><br>书目名称Machine Learning Support for Fault Diagnosis of System-on-Chip网络公开度<br> http://figure.impactfactor.cn/at/?ISSN=BK0620421<br><br> <br><br>书目名称Machine Learning Support for Fault Diagnosis of System-on-Chip网络公开度学科排名<br> http://figure.impactfactor.cn/atr/?ISSN=BK0620421<br><br> <br><br>书目名称Machine Learning Support for Fault Diagnosis of System-on-Chip被引频次<br> http://figure.impactfactor.cn/tc/?ISSN=BK0620421<br><br> <br><br>书目名称Machine Learning Support for Fault Diagnosis of System-on-Chip被引频次学科排名<br> http://figure.impactfactor.cn/tcr/?ISSN=BK0620421<br><br> <br><br>书目名称Machine Learning Support for Fault Diagnosis of System-on-Chip年度引用<br> http://figure.impactfactor.cn/ii/?ISSN=BK0620421<br><br> <br><br>书目名称Machine Learning Support for Fault Diagnosis of System-on-Chip年度引用学科排名<br> http://figure.impactfactor.cn/iir/?ISSN=BK0620421<br><br> <br><br>书目名称Machine Learning Support for Fault Diagnosis of System-on-Chip读者反馈<br> http://figure.impactfactor.cn/5y/?ISSN=BK0620421<br><br> <br><br>书目名称Machine Learning Support for Fault Diagnosis of System-on-Chip读者反馈学科排名<br> http://figure.impactfactor.cn/5yr/?ISSN=BK0620421<br><br> <br><br>
ectropion
发表于 2025-3-21 23:39:27
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少量
发表于 2025-3-22 01:49:41
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GEAR
发表于 2025-3-22 08:24:11
978-3-031-19641-6The Editor(s) (if applicable) and The Author(s), under exclusive license to Springer Nature Switzerl
懒惰民族
发表于 2025-3-22 10:12:09
Book 2023ilures in electronic circuits and systems. The methods discussed can be used for volume diagnosis after manufacturing or for diagnosis of customer returns. Readers will be enabled to deal with huge amount of insightful test data that cannot be exploited otherwise in an efficient, timely manner. Afte
Carcinogenesis
发表于 2025-3-22 13:32:40
Machine Learning and Its Applications in Test,ng algorithms. Then, it explains some popular and commonly used machine learning algorithms. After that, this chapter discusses some recent machine learning-based solutions proposed to solve the VLSI testing problem. It discusses the strength and limitations of these methods. Finally, the last section concludes the chapter.
obnoxious
发表于 2025-3-22 18:29:36
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Oscillate
发表于 2025-3-22 23:17:20
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令人悲伤
发表于 2025-3-23 02:18:18
Machine Learning in Logic Circuit Diagnosis,tegorized into three categories, namely, pre-diagnosis, during-diagnosis, and post-diagnosis to characterize when and how a given methodology enhances the classic outcomes of diagnosis that include localization, failure behavior identification, and root cause of failure.
MUTE
发表于 2025-3-23 09:27:49
Machine Learning Support for Diagnosis of Analog Circuits,t simulation, diagnostic measurement extraction and selection, and the machine learning algorithms that compose the prediction system. We also demonstrate a machine learning-based diagnosis flow on an industrial case study.