FETID 发表于 2025-3-21 19:11:30

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myalgia 发表于 2025-3-21 23:04:20

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fodlder 发表于 2025-3-22 03:02:17

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Incisor 发表于 2025-3-22 05:38:37

Book 20031st editionthe 1990s in connection with the nondestructive testing of materials (NDT, espe­ cially photothermal and thermoelastic investigations). In the early 1990s our group at the Max Planck Institute of Microstructure Physics in Halle had the task to image small leakage currents in silicon solar cells. We

罐里有戒指 发表于 2025-3-22 09:14:21

Otwin Breitenstein,Martin LangenkampFirst book on lock-in thermography, an analytical method applied to the diagnosis of microelectronic devices.Includes supplementary material:

类人猿 发表于 2025-3-22 13:07:05

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foliage 发表于 2025-3-22 17:39:39

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GRATE 发表于 2025-3-22 23:56:00

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阻塞 发表于 2025-3-23 05:25:48

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不可救药 发表于 2025-3-23 05:50:23

Physical and Technical Basics,r describing the figure of merit of different lock-in thermography systems. Section 2.6 deals with the problem of an easy and reliable calibration of lock-in thermography measurement systems by using a resistively heated test structure. The special technique of synchronous undersampling, which allow
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查看完整版本: Titlebook: Lock-in Thermography; Basics and Use for E Otwin Breitenstein,Martin Langenkamp Book 20031st edition Springer-Verlag Berlin Heidelberg 2003