ostensible
发表于 2025-3-26 22:19:51
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微枝末节
发表于 2025-3-27 04:48:46
E-QED: Electrical Bug Localization During Post-silicon Validation Enabled by Quick Error Detection a (9 h on average) we can automatically narrow the location of the bug to (the fan-in logic cone of) a handful of candidate flip-flops (18 flip-flops on average for a design with ~1 Million flip-flops) and also obtain the corresponding bug trace. The area impact of E-QED is ~2.5%. In contrast, determ
Feckless
发表于 2025-3-27 08:17:28
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EPT
发表于 2025-3-27 12:16:44
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从容
发表于 2025-3-27 16:18:44
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Conjuction
发表于 2025-3-27 18:58:21
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