舔食
发表于 2025-3-25 06:42:29
H. Schuberto post-silicon debugging.The innovative techniques covered i.Functional Design Errors in Digital Circuits Diagnosis. covers a wide spectrum of innovative methods to automate the debugging process throughout the design flow: from Register-Transfer Level (RTL) all the way to the silicon die. In partic
实现
发表于 2025-3-25 09:04:05
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Flat-Feet
发表于 2025-3-25 13:34:06
o post-silicon debugging.The innovative techniques covered i.Functional Design Errors in Digital Circuits Diagnosis. covers a wide spectrum of innovative methods to automate the debugging process throughout the design flow: from Register-Transfer Level (RTL) all the way to the silicon die. In partic
Outmoded
发表于 2025-3-25 16:51:49
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比目鱼
发表于 2025-3-25 20:02:56
H. SchubertReduced Ordered Binary Decision Diagrams(ROBDDs), data structures that provide compact representations formany Boolean functions occurring in practical applications. We havenow seen the development of algorithms for functional decompositionwhich work directly based on ROBDDs, so that the decompositi
prosperity
发表于 2025-3-26 02:14:47
H. SchubertReduced Ordered Binary Decision Diagrams(ROBDDs), data structures that provide compact representations formany Boolean functions occurring in practical applications. We havenow seen the development of algorithms for functional decompositionwhich work directly based on ROBDDs, so that the decompositi
laceration
发表于 2025-3-26 06:54:09
H. Schubertwork for post-silicon debugging and layout repair. The solutions provided in this book can greatly reduce debugging effort, enhance design quality, and ultimately enable the design and manufacture of more reliable electronic devices..978-90-481-8112-4978-1-4020-9365-4Series ISSN 1876-1100 Series E-ISSN 1876-1119
生命
发表于 2025-3-26 12:05:56
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FOLLY
发表于 2025-3-26 14:12:00
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高度
发表于 2025-3-26 19:09:28
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