certitude 发表于 2025-3-25 04:34:17

Particle Acceleration and Detectionhttp://image.papertrans.cn/i/image/475142.jpg

Militia 发表于 2025-3-25 08:04:07

978-3-642-26137-4Springer-Verlag Berlin Heidelberg 2010

calumniate 发表于 2025-3-25 14:00:56

Ion Beams in Nanoscience and Technology978-3-642-00623-4Series ISSN 1611-1052 Series E-ISSN 2365-0877

HAVOC 发表于 2025-3-25 16:42:02

https://doi.org/10.1007/978-3-642-00623-4Cluster; Tissue Engineering; crystal; electron microscopy; microscopy; nanomaterial; nanoparticle

熄灭 发表于 2025-3-25 23:36:08

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公式 发表于 2025-3-26 00:42:27

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critique 发表于 2025-3-26 06:23:27

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纤细 发表于 2025-3-26 09:46:16

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违反 发表于 2025-3-26 15:56:31

Box 2: Sputtering ion-target combination and the ion energy, the number of target atoms expelled at perpendicular incidence may vary from the detection limit of 10. to tens of thousands. The most basic parameter of sputtering is the ., defined as the ratio between the number of incident particles and emitted atoms.

Coterminous 发表于 2025-3-26 16:54:09

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查看完整版本: Titlebook: Ion Beams in Nanoscience and Technology; Ragnar Hellborg,Harry J. Whitlow,Yanwen Zhang Book 20101st edition Springer-Verlag Berlin Heidelb