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compassion
发表于 2025-3-21 21:13:25
Special Topics in Metrology, guides for less commonly used methods are in development. In this chapter we present an overview of methods that we find valuable and deserving of more coverage. These methods include statistical process control (SPC), binary measurement systems (BMS), destructive measurements, sample size determination, and Bayesian analysis in metrology.
STERN
发表于 2025-3-22 03:48:38
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FLAX
发表于 2025-3-22 07:22:34
Stephen Crowder,Collin Delker,Nevin MartinProvides R code to support the included methodologies.Draws from case studies used in the National Security Enterprise (NSE).Offers a detailed explanation of uncertainty analysis using the Monte Carlo
TEM
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彩色
发表于 2025-3-22 15:46:15
https://doi.org/10.1007/978-3-030-53329-8International System of Units; measurement standards; traceability chain; uncertainty analysis; propagat
有法律效应
发表于 2025-3-22 17:14:07
Stephen Crowder,Collin Delker,Eric Forrest,Nevin Martinve with large common datasets available to the scientific community.A concerted effort is needed to collate all this information in a centralized place.By having all the information in an Encyclopedia form, we 978-1-4614-6418-1
ALIBI
发表于 2025-3-22 23:41:45
Stephen Crowder,Collin Delker,Eric Forrest,Nevin Martinve with large common datasets available to the scientific community.A concerted effort is needed to collate all this information in a centralized place.By having all the information in an Encyclopedia form, we 978-1-4614-6418-1
SNEER
发表于 2025-3-23 02:31:25
Stephen Crowder,Collin Delker,Eric Forrest,Nevin Martinve with large common datasets available to the scientific community.A concerted effort is needed to collate all this information in a centralized place.By having all the information in an Encyclopedia form, we 978-1-4614-6418-1
尾巴
发表于 2025-3-23 09:01:47
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