nocturnal 发表于 2025-3-27 00:04:30
https://doi.org/10.1007/978-3-8349-8343-5Brand; Differenzierungsmerkmale; Empirische Studie; Loyalität; Markenfans; Markenloyalität; Markenmanageme可忽略 发表于 2025-3-27 04:35:59
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http://reply.papertrans.cn/47/4663/466248/466248_33.pngPlaque 发表于 2025-3-27 12:54:14
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Forschungsgruppe Konsum und Verhaltenhttp://image.papertrans.cn/i/image/466248.jpg装勇敢地做 发表于 2025-3-27 20:14:57
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Bruce L. Yoderle Event Effect (SEE). TID is observed for metal oxide semiconductor (MOS) devices when charges are accumulated in oxide and interface between oxide and semiconductor. DDD is the degradation of semiconductor devices due to the creation of crystal damage by irradiation. SEE occurs by charge generatedInitiative 发表于 2025-3-28 05:24:50
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