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Alain Prochiantz,Gaäll Mainguy,Laure Sonnier,Isabelle Caillé,Brigitte Lesaffre,Michel Volovitch,Alaipenalty in test application time, test efficiency, or performance, savings in power dissipation during test application in large scan sequential circuits can be achieved in very low computation time. The technique is based on a multiple scan chain-based DFT architecture and a multiple scan chain-bas滑动 发表于 2025-3-27 21:31:09
0302-9743 ent of Information, HIMI 2024, held as part of the 26th International Conference on Human-Computer Interaction, HCI International 2024 (HCII 2024), was held as a hybrid event in Washington DC, USA, during June/July 2024. .. ..The total of 1271 papers and 309 posters included in the HCII 2023 proceed