Peristalsis 发表于 2025-3-23 12:26:11
http://reply.papertrans.cn/47/4638/463754/463754_11.pngfoppish 发表于 2025-3-23 16:48:06
y ofbidding behaviour, the development of expectations, the analysis ofeconomic growth, the learning in the repeated prisoner‘s dilemma, andthe changes of cognitive models during economic transition. The workeven includes innovative ways of modelling learning that are notcommon in the literature, foAmplify 发表于 2025-3-23 21:12:15
http://reply.papertrans.cn/47/4638/463754/463754_13.png条约 发表于 2025-3-24 00:47:16
http://reply.papertrans.cn/47/4638/463754/463754_14.png骚动 发表于 2025-3-24 04:36:51
http://reply.papertrans.cn/47/4638/463754/463754_15.pngosteoclasts 发表于 2025-3-24 07:01:49
Anna Leandery elements, and through their spatial arrangement is presented for the simple case of a linear, one-dimensional array. The basic principles are then applied to the case of a two-dimensional configuration which has the ability to generate beam steering through proper tuning of the excitation frequencAGOG 发表于 2025-3-24 13:11:07
Marcel Merleh is limited to the small region around the discontinuity. The co-existence of two scales in the model is handled through the application of proper bridging relations between the two scales, and the generation of interaction forces at the interfaces according to the .. This technique allows a coarse唤起 发表于 2025-3-24 18:18:47
Susan Strangey elements, and through their spatial arrangement is presented for the simple case of a linear, one-dimensional array. The basic principles are then applied to the case of a two-dimensional configuration which has the ability to generate beam steering through proper tuning of the excitation frequenc柳树;枯黄 发表于 2025-3-24 19:49:49
http://reply.papertrans.cn/47/4638/463754/463754_19.pngjaundiced 发表于 2025-3-25 00:28:38
Jean-Pierre Coliny boundary for changing system conditions and proposes a uniformed framework that provides computational approaches for both short-term and long-term voltage stability phenomena..978-1-4419-3862-6978-0-387-32935-2Series ISSN 2196-3185 Series E-ISSN 2196-3193