连接
发表于 2025-3-25 04:07:23
Quiescent Current Analysis and Experimentation of Defective CMOS Circuits,e 3-inverter chain with a defective inverter. The results are compared with experimental data of integrated circuits fabricated with intentional defects. The influence of the characteristics of each defect on .. has been investigated by electrical simulation and experimentation.
Mere仅仅
发表于 2025-3-25 08:26:03
Generation and Evaluation of Current and Logic Tests for Switch-Level Sequential Circuits,rithm for generating current and logic tests is introduced. Clear definitions for analyzing the effectiveness of the joint test generation approach are derived. Experimental results are presented for demonstrating high coverage of stuck-at, stuck-on, and stuck-open faults for switch level circuits when both current and logic tests are used.
技术
发表于 2025-3-25 14:56:53
Proportional BIC Sensor for Current Testing,portional to i. Additional features are the possibility of continuous measure of i. and increased speed of this sensor compared with sensors based on the current integration principle. The design does not have substrate currents due to the parasitic vertical BJTs. Experimental work on the sensor is reported.
Brittle
发表于 2025-3-25 18:22:59
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jaundiced
发表于 2025-3-25 23:44:58
Reliability Benefits of ,,,al CMOS technology, the user obtains a product with greater reliability. The data presented within this article, along with increasing customer focus on zero defects, clearly support I. implementation.
pineal-gland
发表于 2025-3-26 02:55:07
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沙漠
发表于 2025-3-26 05:23:26
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abolish
发表于 2025-3-26 12:12:27
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使厌恶
发表于 2025-3-26 13:43:37
978-1-4613-6377-4Springer Science+Business Media New York 1993
享乐主义者
发表于 2025-3-26 19:02:27
https://doi.org/10.1007/978-1-4615-3146-3CMOS; VLSI; complexity; computer-aided design (CAD); integrated circuit; logic; metal-oxide-semiconductor