气候 发表于 2025-3-28 16:43:46

https://doi.org/10.1007/978-1-4615-3250-7Leistungsfeldeffekttransistor; MOSFET; VLSI; circuit; diagnosis; field-effect transistor; metal oxide semi

摇曳的微光 发表于 2025-3-28 22:45:46

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查看完整版本: Titlebook: Hot-Carrier Reliability of MOS VLSI Circuits; Yusuf Leblebici,Sung-Mo (Steve) Kang Book 1993 Springer Science+Business Media New York 1993