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Hierarchical Modeling for VLSI Circuit Testing978-1-4613-1527-8Series ISSN 0893-3405
galley
发表于 2025-3-24 00:19:25
Introduction, during several phases of its production, and also while it is being used in the field, to verify that it is working according to specifications. In the last two decades, circuit design and device fabrication processes have advanced rapidly, resulting in very large-scale integrated (VLSI) circuits c
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Design for Testability,Chapter 3. It is clear from the previous two chapters that this approach is particularly well suited to circuits such as ripple-carry adders and parity checkers which contain repeated subcircuits interconnected in a regular fashion. A bus-oriented high-level model can be easily constructed following
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TAP
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Michel Mendès France,Ahmed Sebbarutomated method for query construction for cross-language information retrieval (CLIR). This method seeks to automatically extract topical information from request sentences written in one of the source languages and to create a target language query, based on translations given by a translation dic
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