Mingle
发表于 2025-3-23 12:21:14
James Ledouxstant . > 0:.and . is a simple closed contour in this region with . in its interior. Since . is analytic in this region, we can deform the path . until it is an arbitrarily small circle around .. This would not be possible if the Laurent series was only convergent on the annulus 0<. < |. — .| < .. T
不可思议
发表于 2025-3-23 15:22:39
Tadashi Dohi,Katerina Goševa-Popstojanova,Kalyanaraman Vaidyanathan,Kishor S. Trivedi,Shunji Osakistant . > 0:.and . is a simple closed contour in this region with . in its interior. Since . is analytic in this region, we can deform the path . until it is an arbitrarily small circle around .. This would not be possible if the Laurent series was only convergent on the annulus 0<. < |. — .| < .. T
Enrage
发表于 2025-3-23 19:19:56
Mitsuhiro Kimura,Shigeru Yamada the exponential function very early but does so rigorously. It covers the usual topics of functions, differentiation, analyticity, contour integration, the theorems of Cauchy and their many consequences, Taylor and Laurent series, residue theory, the computation of certain improper real integrals,
BARB
发表于 2025-3-23 22:41:55
http://reply.papertrans.cn/43/4221/422076/422076_14.png
LEERY
发表于 2025-3-24 03:35:41
Statistical Reliability Change-point Estimation Modelsal change-point model are the dependent sample and the unknown sample size, which is particular to software reliability analysis. When the sample size is assumed to be known, the model discussed is the one used for hardware reliability analysis. By using a classical software reliability model, we ha
同步左右
发表于 2025-3-24 07:08:59
http://reply.papertrans.cn/43/4221/422076/422076_16.png
土产
发表于 2025-3-24 13:11:09
http://reply.papertrans.cn/43/4221/422076/422076_17.png
镇压
发表于 2025-3-24 17:52:27
http://reply.papertrans.cn/43/4221/422076/422076_18.png
溃烂
发表于 2025-3-24 20:49:24
http://reply.papertrans.cn/43/4221/422076/422076_19.png
Neonatal
发表于 2025-3-25 02:11:52
Book 2003 a microelectronic device to software fault tolerance and from the accelerated life testing of mechanical components to hardware verification, a common underlying philosophy of reliability applies. Defining both fundamental and applied work across the entire systems reliability arena, this state-of-