清楚
发表于 2025-3-25 05:22:31
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outskirts
发表于 2025-3-25 09:47:33
https://doi.org/10.1057/978-1-137-49107-7ble structure changes (e.g., plastic deformation, cracking, rupture). The emitted acoustic waves are captured by sensors attached to the material’s surface. The technique considers the wave arrival time and the wave propagation speed to accurately locate in space and in time the wave source and the
MAZE
发表于 2025-3-25 12:50:16
https://doi.org/10.1007/978-3-319-94379-4the inner structure of solid materials and components. At the beginning, a short introduction into acoustic microscopy and its preferences is given. In part 2, the basics of ultrasonic wave propagation in an acoustic microscope are explained in terms of wave front snapshots calculated by numerical s
共同确定为确
发表于 2025-3-25 17:40:34
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Fulsome
发表于 2025-3-25 21:35:03
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图画文字
发表于 2025-3-26 00:48:12
https://doi.org/10.1007/978-3-319-62247-7ectrical conductive materials. This chapter gives brief introduction of theories and applications of advanced ECT, with emphases on the probe design and numerical simulation methods. The chapter moves from short historical and status reviews of the ECT technique, a basic understanding of ECT princip
Interim
发表于 2025-3-26 07:25:07
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改变立场
发表于 2025-3-26 10:51:11
Dough Maturation and Developmentplication of a small amplitude, alternating current signal to the systems, and therefore is considered a non-destructive technique. This chapter begins with a brief introduction of the fundamentals of EIS, then focuses on instrumentation characteristics, especially the various electrode configuratio
Sinus-Rhythm
发表于 2025-3-26 15:28:16
Structure of the Participatory World-Systemring due to its nondestructive nature and inherent simplicity. There have been increasing needs to extend the capabilities of ellipsometry to spatially resolve materials and structures with micro- and nanoscale features. In this chapter, the basic principle of ellipsometry will be reviewed, and two
nonplus
发表于 2025-3-26 20:47:22
https://doi.org/10.1007/978-3-8349-7136-4lectivity to determine near-surface density is described and the determination of surface interface width presented. It is shown how measurement of the diffuse scatter is necessary in order to distinguish topological surface roughness from compositional grading, as both effects have an identical eff