Cocker 发表于 2025-3-26 23:51:11
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10楼向宇宙 发表于 2025-3-27 22:07:52
Yield Evaluation of a Soft-Configurable WSI Switch Networkirectly from the circuit layout provide yield estimates for each circuit piece. Such simulations predict that random point defects will cause less than 1% of the 1266-transistor switches to fail. Yield estimates for each circuit piece are used as inputs to a yield model to evaluate the fault tolerance of the entire design.Charade 发表于 2025-3-28 05:37:23
http://reply.papertrans.cn/35/3459/345848/345848_38.pngInvigorate 发表于 2025-3-28 07:47:43
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