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向宇宙 发表于 2025-3-27 22:07:52

Yield Evaluation of a Soft-Configurable WSI Switch Networkirectly from the circuit layout provide yield estimates for each circuit piece. Such simulations predict that random point defects will cause less than 1% of the 1266-transistor switches to fail. Yield estimates for each circuit piece are used as inputs to a yield model to evaluate the fault tolerance of the entire design.

Charade 发表于 2025-3-28 05:37:23

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Invigorate 发表于 2025-3-28 07:47:43

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