相似 发表于 2025-3-21 17:36:04

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友好 发表于 2025-3-21 23:16:30

Applications and Limitations of Sims,han 10 nm can be achieved with sensitivities down to 1 x 10. atoms/cm. for the important dopant elements. The lateral resolution of the technique under ideal circumstances can be better than 0.5 μm. Practical and theoretical limitations in three-dimensional depth profiling are discussed.

Dedication 发表于 2025-3-22 03:26:17

Electron Spectroscopies for Studying Chemical Bondings at Surfaces,hniques that has just recently grazed the area of 10 microns lateral resolution. The situation is even worse if one realizes that most of the corresponding instruments are still one or two orders of magnitude above that last figure. This could summarize the unfortunate (?) present status of the grou

VEIL 发表于 2025-3-22 05:18:22

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hermetic 发表于 2025-3-22 09:35:15

Scattered Electrons in Biological Structure Determination, particularly favourable place. The wavelength of the particle at an energy of 100 keV is about 0.0037 nm, offering the promise of high spatial resolution. Its cross-section of interaction with matter is sufficiently small to penetrate a specimen 100 nm thick with ease, but large enough to interact

机械 发表于 2025-3-22 14:58:24

Energy Deposition by X-Rays and Electrons,ew the nature of the interaction of these particles with matter. Our discussion will not break new ground; in fact, it will remain rather elementary. A general bibliograpy for further study will be provided, however..

机械 发表于 2025-3-22 20:40:24

Synchrotron Radiation and the Submicron World: Selected Activities at the Daresbury Laboratory, UK,t the use of SR has become an accepted technique for the study of macromolcules such as proteins, partially ordered materials such as muscles and polymers, and other materials in both crystalline and amorphous forms. This review outlines the principles of SR production and indicates how SR is being

Legion 发表于 2025-3-22 22:10:08

Properties of Polymer Resists,ature, contact microradiography.. Advances in the microelectronics industry and efforts to increase the number of elements in integrated circuits have led to improvements in lithographic techniques recently. For contact microscopy using x-rays important products of these advances has been the availa

conspicuous 发表于 2025-3-23 04:09:41

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Constitution 发表于 2025-3-23 08:40:33

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查看完整版本: Titlebook: Examining the Submicron World; Ralph Feder,J. Wm. McGowan,Douglas M. Shinozaki Book 1986 Plenum Press, New York 1986 Design.Image.Nation.e