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Focused Ion Beam Induced Deposition,2.5µΩcm.) Deposition yields (atoms deposited per incident ion) of 4 to 100 have been observed. But the higher yields correlate with higher resistivity and higher impurity content. Preliminary transmission electron microscope examination shows the gold films to start out as unconnected islands of 40Antagonist 发表于 2025-3-31 03:17:58
Harlem Street Speakers in the 1930s,ure 1, we note that the most recent data shows a leveling off of the rate of change of either reduction in device dimension or reduction in cost per bit. This levelling off reflects changes in and current constraints to device and processing technology, and suggests re-evaluation of “traditional” maDorsal 发表于 2025-3-31 06:34:00
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Rosie Alexander,Tristram Hooley2.5µΩcm.) Deposition yields (atoms deposited per incident ion) of 4 to 100 have been observed. But the higher yields correlate with higher resistivity and higher impurity content. Preliminary transmission electron microscope examination shows the gold films to start out as unconnected islands of 40起草 发表于 2025-4-1 01:14:59
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