旧石器时代 发表于 2025-3-28 17:05:36

How Does Inverse Temperature Dependence Affect Timing Sign-Offmperature rises. Hence the device performance depends on the racing condition of electron mobility and V. together as temperature rises. Traditionally, timing is signed off at two extreme temperature corners, one representing the best case and the other representing the worst case. With ITD, the hig

coltish 发表于 2025-3-28 20:51:59

CMOS Logic Gates Leakage Modeling Under Statistical Process Variations, the reverse-biased drain and source substrate junction band to band tunneling (Ibtbt), and the gate induced drain leakage (Igidl). Each of those leakage currents becomes significant in nano-scaled devices tightening the constraints of nowadays digital designs .

Ascendancy 发表于 2025-3-29 00:07:23

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不透气 发表于 2025-3-29 04:44:15

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corpuscle 发表于 2025-3-29 09:25:31

Sport-Related Structural Brain Injury,l the damage, the plasma-induced defects in Si surface layer should be quantitatively estimated, and then, plasma designs should be optimized. Defect generation probability was proposed from an optical analysis as a measure of the damage , on one hand. With regard to plasma design, on the other,

连系 发表于 2025-3-29 14:40:50

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facilitate 发表于 2025-3-29 16:12:09

Pharmacology of the , Nervous Systemmperature rises. Hence the device performance depends on the racing condition of electron mobility and V. together as temperature rises. Traditionally, timing is signed off at two extreme temperature corners, one representing the best case and the other representing the worst case. With ITD, the hig

MUMP 发表于 2025-3-29 20:19:22

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EVICT 发表于 2025-3-30 00:48:39

1876-1100 ues and solutions, advanced memories and analog and mixed signals. All these papers are focusing on design and technology interactions and comply with the scope of the conference.978-94-007-3353-4978-90-481-9379-0Series ISSN 1876-1100 Series E-ISSN 1876-1119

HALL 发表于 2025-3-30 05:19:18

Synergy Between Design and Technology: A Key Factor in the Evolving Microelectronic Landscapeed as early as in 1965 in his visionary paper A virtuous innovation circle which fuelled the exponentional growth in revenue of this industry The decoupling of process and design flows with clear interfaces and sign-offs
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查看完整版本: Titlebook: Emerging Technologies and Circuits; Amara Amara,Thomas Ea,Marc Belleville Book 2010 Springer Science+Business Media B.V. 2010 CMOS.FinFET.