狗窝 发表于 2025-3-23 10:30:10

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GRIEF 发表于 2025-3-23 14:12:47

https://doi.org/10.1007/978-1-84628-784-8The problem of testing complex SoC architectures has attracted researchers’ interest the recent years because it is a problem of increasing difficulty and importance for the electronic circuits development community.

SENT 发表于 2025-3-23 19:52:24

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EWE 发表于 2025-3-24 01:36:43

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贿赂 发表于 2025-3-24 02:40:53

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学术讨论会 发表于 2025-3-24 09:21:22

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adj忧郁的 发表于 2025-3-24 14:04:43

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QUAIL 发表于 2025-3-24 15:18:05

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VEIL 发表于 2025-3-24 20:58:14

https://doi.org/10.1007/978-1-4020-2801-4SoC; automation; development; diagnosis; integrated circuit; logic; microcontroller; microprocessor; tables

flaggy 发表于 2025-3-25 00:43:13

Mengen – Relationen – Funktionen, multi-functional and high-performance electronic systems. According to the prediction of the 2003 International Technology Roadmap for Semiconductors (ITRS) , by year 2018 the half pitch. of dynamic random access memories (DRAM), microprocessors and application-specific ICs (ASIC) will drop to
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查看完整版本: Titlebook: Embedded Processor-Based Self-Test; Dimitris Gizopoulos,Antonis Paschalis,Yervant Zori Book 2004 Springer Science+Business Media New York