针叶
发表于 2025-3-25 07:18:48
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咆哮
发表于 2025-3-25 07:55:50
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描述
发表于 2025-3-25 13:35:37
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积习难改
发表于 2025-3-25 15:50:52
Overdetermined and Underdetermined Systemsics is the most prevalent nanotechnology. The continued decrease in device feature size has challenged spectroscopic ellipsometry (SE) with nano-films, nanowires, and nano-dots. There are many examples of the measurement of thin dielectric films , and now there are examples of crystalline semi
nettle
发表于 2025-3-25 23:09:55
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Rustproof
发表于 2025-3-26 00:39:37
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CAJ
发表于 2025-3-26 07:55:39
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保全
发表于 2025-3-26 12:11:37
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LUCY
发表于 2025-3-26 13:46:46
Spectroscopic Ellipsometry of Nanoscale Materials for Semiconductor Device Applications,, nanowires, and nano-dots. There are many examples of the measurement of thin dielectric films , and now there are examples of crystalline semiconductor nanowires in the form of the Fin in the transistor known as a Fin-FET . The semiconductor industry is also working on materials for “beyond CMOS” devices.
导师
发表于 2025-3-26 19:05:22
Ellipsometry of Semiconductor Nanocrystals,ielectric function of single-crystalline semiconductors can be determined on high quality reference materials. The accuracy of the reference data depends mostly on the numerical or experimental elimination of the surface effects like oxides, nanoroughness, contamination, etc.