aspersion
发表于 2025-3-26 23:41:37
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Ingredient
发表于 2025-3-27 02:00:40
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顾客
发表于 2025-3-27 06:04:27
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生来
发表于 2025-3-27 12:22:52
Background Anomalies in Electron Probe Microanalysis Caused by Total Reflection,istic X-rays cause this effect. The critical angles of total reflection are determined for a set of X-ray lines. It is shown, that total reflection may occur with all analyzing crystals which are used in electron probe microanalysis.
Palpate
发表于 2025-3-27 16:46:40
978-3-211-82359-0Springer-Verlag Wien 1992
Asparagus
发表于 2025-3-27 17:47:33
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Tonometry
发表于 2025-3-27 23:11:38
https://doi.org/10.1007/978-3-7091-6679-6ceramics; materials science; metals; spectroscopy; structure
使习惯于
发表于 2025-3-28 05:42:25
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包租车船
发表于 2025-3-28 09:54:04
Auger Microscopy and Electron Probe Microanalysis, with the determination of the Auger backscattering factor or the Φ(0) function in EPMA..Some commonly admitted opinions are reconsidered. The main result is that, in spite of some differences, each technique may benefit from the progress established in the other technique, instead of ignoring each other.
sorbitol
发表于 2025-3-28 14:06:54
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