Breach 发表于 2025-3-23 13:42:30

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辫子带来帮助 发表于 2025-3-23 17:17:58

The Art of Identifying Deception,listed in Section 4.2.1 (the electron beam direction ., the indices of the planes giving rise to the image ., and the deviation from the Bragg condition..) has been obtained and is therefore available for interpreting the corresponding micrograph.

后来 发表于 2025-3-23 19:05:21

Stephen J. Lockwood,Alexa B. Kimballretation of bulk analysis using EDX or WDX detectors. The interpretation of data from bulk samples is more involved and the major differences between thin foil and bulk analysis are discussed in Section 6.3 and have also been covered in Chapter 2.

orthodox 发表于 2025-3-24 01:14:52

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anagen 发表于 2025-3-24 03:51:32

Analysis of Micrographs in TEM, STEM, HREM and SEM,listed in Section 4.2.1 (the electron beam direction ., the indices of the planes giving rise to the image ., and the deviation from the Bragg condition..) has been obtained and is therefore available for interpreting the corresponding micrograph.

战役 发表于 2025-3-24 07:58:46

Interpretation of Analytical Data,retation of bulk analysis using EDX or WDX detectors. The interpretation of data from bulk samples is more involved and the major differences between thin foil and bulk analysis are discussed in Section 6.3 and have also been covered in Chapter 2.

cyanosis 发表于 2025-3-24 10:56:57

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Expediency 发表于 2025-3-24 17:30:43

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自由职业者 发表于 2025-3-24 21:58:40

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Preamble 发表于 2025-3-25 00:04:34

Results of the Empirical Study,id instruments. Partly because the individual instruments have been developed separately, and partly because some instruments generate data which are more immediately interpretable, the fundamental relationships between the techniques and instruments tend to be obscured. The aims of this book are fi
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查看完整版本: Titlebook: Electron Beam Analysis of Materials; M. H. Loretto Book 1984 Springer Science+Business Media B.V. 1984 X-ray.crystal.diffraction.electron