伪善
发表于 2025-3-25 04:23:10
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水獭
发表于 2025-3-25 09:22:16
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有恶意
发表于 2025-3-25 13:21:26
Current Calculation,This chapter presents how the average and RMS current values are calculated to model the EM effects in this work. ..
山羊
发表于 2025-3-25 18:06:36
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轻浮女
发表于 2025-3-25 23:14:21
https://doi.org/10.1007/978-3-0348-8608-6lacement, respectively, at 2 GHz. The best and worst TTF values correspond to the largest and smallest lifetimes over all pin candidates. The TTF is calculated for two different switching activities (.) of 50 and 100 % of the clock frequency: although few cells in a layout switch frequently, it is l
领袖气质
发表于 2025-3-26 01:24:31
https://doi.org/10.1007/978-981-19-6095-6e cells. In this Chapter we are testing the EM effects at circuit level, on the nets that connect the cells (Posser et al. .). As the nets are signal wires, the direction of current flow is bidirectional and generally is referred as AC electromigration. The AC electromigration has become a serious c
鸽子
发表于 2025-3-26 06:11:20
Saints, Ideology, and Stage Tropes,ails within a standard cell. A new modeling approach that includes Joule heating effects and current divergence is presented. Based on the review through the literature, few works are concerned with cell-internal EM. To our knowledge, there are no other published approach addressing this problem dir
人工制品
发表于 2025-3-26 08:52:45
https://doi.org/10.1007/978-3-319-48899-8Circuit reliability; Electromigration Techniques; Electromigration Modeling; cell-internal signal elect
leniency
发表于 2025-3-26 16:03:50
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Intercept
发表于 2025-3-26 19:44:38
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