Aura231
发表于 2025-3-23 13:09:17
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fatuity
发表于 2025-3-23 16:07:18
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DIS
发表于 2025-3-23 21:10:06
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期满
发表于 2025-3-24 01:13:31
Measurement Methods,ard methods promoted by IEC 61967 for emission, namely the TEM/GTEM, the near-field scan, the Workbench Faraday Cage and the 1/150Ω conducted methods. Concerning susceptibility, we detail the Bulk Current Injection and Direct Power Injection methods from the IEC standard 62132. Furthermore, impulse
fulcrum
发表于 2025-3-24 04:55:58
Case Studies,icrocontrollers from several IC manufacturers are measured using standard methods and predicted using a macro-modeling approach. Specific test chips dedicated to the characterization of internal switching noise and to the validation of low emission design techniques are also described.
Arboreal
发表于 2025-3-24 08:39:14
Guidelines,d circuits. Both layout level and package-related guidelines are presented. Concerning immunity, a set of defensive software techniques applicable to microcontrollers is also described. These guidelines have been applied successfully to several commercial products as well as specific test circuits.
Pepsin
发表于 2025-3-24 13:20:38
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大量
发表于 2025-3-24 18:55:05
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带来
发表于 2025-3-24 19:35:41
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glacial
发表于 2025-3-25 01:03:28
https://doi.org/10.1007/978-3-7091-9790-5and provides an outline of IC modeling for EMC prediction. A brief description of electric and magnetic field coupling, conducted and radiated mode emissions, as well as susceptibility, are also given in this chapter.