SCIE(SCI)期刊Surface Topography-Metrology and Properties(20 21 REV HIST)影响因子<br> http://impactfactor.cn/2024/if/?ISSN=2051-672X<br><br> SCIE(SCI)期刊Surface Topography-Metrology and Properties(SURF TOPOGR-METROL)影响因子@(工程,机械)学科排名<br> http://impactfactor.cn/2024/ifr/?ISSN=2051C672X<br><br> SCIE(SCI)期刊Surface Topography-Metrology and Properties(20 21 REV HIST)总引论文<br> http://impactfactor.cn/2024/at/?ISSN=2051-672X<br><br> SCIE(SCI)期刊Surface Topography-Metrology and Properties(SURF TOPOGR-METROL)总引论文@(工程,机械)学科排名<br> http://impactfactor.cn/2024/atr/?ISSN=2051C672X<br><br> SCIE(SCI)期刊Surface Topography-Metrology and Properties(20 21 REV HIST)影响因子<br> http://impactfactor.cn/2024/tc/?ISSN=2051-672X<br><br> SCIE(SCI)期刊Surface Topography-Metrology and Properties(SURF TOPOGR-METROL)总引频次@(工程,机械)学科排名<br> http://impactfactor.cn/2024/tcr/?ISSN=2051C672X<br><br> SCIE(SCI)期刊Surface Topography-Metrology and Properties(20 21 REV HIST)即时影响因子<br> http://impactfactor.cn/2024/ii/?ISSN=2051-672X<br><br> SCIE(SCI)期刊Surface Topography-Metrology and Properties(SURF TOPOGR-METROL)即时影响因子@(工程,机械)学科排名<br> http://impactfactor.cn/2024/iir/?ISSN=2051C672X<br><br> SCIE(SCI)期刊Surface Topography-Metrology and Properties(20 21 REV HIST)五年累积影响因子<br> http://impactfactor.cn/2024/5y/?ISSN=2051-672X<br><br> SCIE(SCI)期刊Surface Topography-Metrology and Properties(SURF TOPOGR-METROL)五年累积影响因子@(工程,机械)学科排名<br> http://impactfactor.cn/2024/5yr/?ISSN=2051C672X<br><br>
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Submitted on: 05 November 2022.
Revised on: 09 December 2022.
Accepted on: 24 December 2022.
Surface Topography-Metrology and Properties
Submitted on: 12 February 2004.
Revised on: 17 March 2004.
Accepted on: 09 April 2004.
Surface Topography-Metrology and Properties
Submitted on: 12 February 2008.
Revised on: 03 March 2008.
Accepted on: 24 March 2008.
Surface Topography-Metrology and Properties
Submitted on: 17 June 2001.
Revised on: 28 June 2001.
Accepted on: 06 July 2001.
Surface Topography-Metrology and Properties
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Submitted on: 19 July 2011.
Revised on: 11 August 2011.
Accepted on: 20 August 2011.
Surface Topography-Metrology and Properties