memoir
发表于 2025-3-21 18:11:41
书目名称Development and Characterization of a Dispersion-Encoded Method for Low-Coherence Interferometry影响因子(影响力)<br> http://figure.impactfactor.cn/if/?ISSN=BK0269900<br><br> <br><br>书目名称Development and Characterization of a Dispersion-Encoded Method for Low-Coherence Interferometry影响因子(影响力)学科排名<br> http://figure.impactfactor.cn/ifr/?ISSN=BK0269900<br><br> <br><br>书目名称Development and Characterization of a Dispersion-Encoded Method for Low-Coherence Interferometry网络公开度<br> http://figure.impactfactor.cn/at/?ISSN=BK0269900<br><br> <br><br>书目名称Development and Characterization of a Dispersion-Encoded Method for Low-Coherence Interferometry网络公开度学科排名<br> http://figure.impactfactor.cn/atr/?ISSN=BK0269900<br><br> <br><br>书目名称Development and Characterization of a Dispersion-Encoded Method for Low-Coherence Interferometry被引频次<br> http://figure.impactfactor.cn/tc/?ISSN=BK0269900<br><br> <br><br>书目名称Development and Characterization of a Dispersion-Encoded Method for Low-Coherence Interferometry被引频次学科排名<br> http://figure.impactfactor.cn/tcr/?ISSN=BK0269900<br><br> <br><br>书目名称Development and Characterization of a Dispersion-Encoded Method for Low-Coherence Interferometry年度引用<br> http://figure.impactfactor.cn/ii/?ISSN=BK0269900<br><br> <br><br>书目名称Development and Characterization of a Dispersion-Encoded Method for Low-Coherence Interferometry年度引用学科排名<br> http://figure.impactfactor.cn/iir/?ISSN=BK0269900<br><br> <br><br>书目名称Development and Characterization of a Dispersion-Encoded Method for Low-Coherence Interferometry读者反馈<br> http://figure.impactfactor.cn/5y/?ISSN=BK0269900<br><br> <br><br>书目名称Development and Characterization of a Dispersion-Encoded Method for Low-Coherence Interferometry读者反馈学科排名<br> http://figure.impactfactor.cn/5yr/?ISSN=BK0269900<br><br> <br><br>
Interim
发表于 2025-3-21 22:25:01
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发表于 2025-3-22 01:29:19
Grid Resource Management in Legion range, three-dimensional measurement capabilities and speed. The following chapter introduces a novel approach to surface profilometry which aims to provide solutions to the problems named. The basic setup for all experiments is centered around a two-beam interferometer of the M. type.
乏味
发表于 2025-3-22 05:11:09
Ten Actions When Grid Schedulingtrate materials. Due to the usage of thin-film technologies in high-volume production in e.g. the photovoltaics and semiconductor industry, process monitoring becomes relevant in order to ensure functional parameters such as solar cell efficiency, . In this context, film thickness as well as fi
lactic
发表于 2025-3-22 12:47:13
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门闩
发表于 2025-3-22 13:57:12
Surface Profilometry, range, three-dimensional measurement capabilities and speed. The following chapter introduces a novel approach to surface profilometry which aims to provide solutions to the problems named. The basic setup for all experiments is centered around a two-beam interferometer of the M. type.
门闩
发表于 2025-3-22 19:09:58
https://doi.org/10.1007/978-3-658-35926-3surface metrology; profilometry; interferometry; low-coherence interferometry; semiconductor manufacturi
小母马
发表于 2025-3-23 00:13:06
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去掉
发表于 2025-3-23 03:11:06
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allergen
发表于 2025-3-23 08:03:25
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