迫击炮
发表于 2025-3-30 10:13:37
Synthesis of FPGAs and Testable ASICs,can logic must be inserted, test vectors generated and fault grading performed to ensure a high level of testability. These efforts complicate and delay the conversion of FPGA designs to ASICs but must be considered by designers of microelectronic systems. Topics covered include: design flow; system
共栖
发表于 2025-3-30 16:27:15
Book 2007bstraction, from system level to physical design. The third part deals with test methods. The topic is addressed from different viewpoints: in terms of chip complexity, test is discussed from the core and system prospective; in terms of signal heterogeneity, the digital, mixed-signal and microsystem