Jaundice
发表于 2025-3-21 18:30:39
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拍下盗公款
发表于 2025-3-21 22:30:37
978-1-4757-8291-2Springer Science+Business Media New York 2000
Monolithic
发表于 2025-3-22 01:07:39
Design for AT-Speed Test, Diagnosis and Measurement978-0-306-47544-3Series ISSN 0929-1296
雄辩
发表于 2025-3-22 07:46:50
Frontiers in Electronic Testinghttp://image.papertrans.cn/d/image/268619.jpg
babble
发表于 2025-3-22 10:19:24
http://reply.papertrans.cn/27/2687/268619/268619_5.png
faculty
发表于 2025-3-22 14:50:36
Book 2000 system design engineers, test engineersand product managers at the silicon level as well as at the board andsystems levels. Designers will see how the implementation of embeddedtest enables simplification of silicon debug and system bring-up. Testengineers will determine how embedded test provides
faculty
发表于 2025-3-22 17:12:21
Book 2000ime, resources and costs associated with test development,manufacture cost and lifecycle maintenance of their products can besignificantly reduced by designing embedded test in the product. Acomplete design flow and analysis of the impact of embedded test on adesign makes this book a `must read‘ before any DFT is attempted.
掺和
发表于 2025-3-23 00:35:51
0929-1296 o chip and system design engineers, test engineersand product managers at the silicon level as well as at the board andsystems levels. Designers will see how the implementation of embeddedtest enables simplification of silicon debug and system bring-up. Testengineers will determine how embedded test
aplomb
发表于 2025-3-23 04:39:45
Hierarchical Core Test,rted. Embedded test is an important part in this solution because of its inherent bandwidth scalability, ability to test at speed, and suitability for reuse at the board and system levels. Automation ensures repeatability and predictability of the process to meet time-to-market needs.
miracle
发表于 2025-3-23 06:01:09
Design for AT-Speed Test, Diagnosis and Measurement