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2190-5053numerically evaluated on two benchmark problems, such as a rectangular waveguide and a permanent magnet synchronous machine. Results showed that the new methods can significantly reduce the computational effor978-3-031-37021-2978-3-031-37019-9Series ISSN 2190-5053 Series E-ISSN 2190-5061
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978-3-031-37021-2The Editor(s) (if applicable) and The Author(s), under exclusive license to Springer Nature Switzerl
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Design Methods for Reducing Failure Probabilities with Examples from Electrical Engineering978-3-031-37019-9Series ISSN 2190-5053 Series E-ISSN 2190-5061
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Application Examples of STATCOMany kind of design processes which are affected by uncertainties. The reader who is not interested in the application to electrotechnical devices can skip this chapter, in which an introduction to electromagnetism is provided.
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Theresa Beaubouef,Frederick Petry Besides the estimation of the yield, e.g. with one of the methods presented in Chap. 4, the maximization of the yield is the next natural task. This chapter deals with different methods for yield optimization, depending on the specific problem and the information available.
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