过份
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量被毁坏
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Edna Iliana Tamariz-Flores,Kevin Abid García-Juárez,Richard Torrealba-Meléndez,Jesús Manuel Muñoz-Pad to this unique solution, facilitating its practical implementation. This book is a valuable resource for experts, consultants, engineers, scientists, and students in the Smart Grids area and actors of the electricity market and politicians..978-3-030-81532-5978-3-030-81530-1Series ISSN 1612-1287 Series E-ISSN 1860-4676
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Peter Jones,Steve Baronting, RF Testing and Loaded Board Testing. Contributing authors are affiliated with (in alphabetical order) Agilent, ARM, Balearic Islands Univ., IBM, Inovys, Intel, LogicVision, Magma, Mentor Graphics, New Mex978-1-4899-8773-0978-0-387-29409-4Series ISSN 0929-1296
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