Chylomicron
发表于 2025-3-21 18:09:31
书目名称Dependability in Electronic Systems影响因子(影响力)<br> http://impactfactor.cn/if/?ISSN=BK0265693<br><br> <br><br>书目名称Dependability in Electronic Systems影响因子(影响力)学科排名<br> http://impactfactor.cn/ifr/?ISSN=BK0265693<br><br> <br><br>书目名称Dependability in Electronic Systems网络公开度<br> http://impactfactor.cn/at/?ISSN=BK0265693<br><br> <br><br>书目名称Dependability in Electronic Systems网络公开度学科排名<br> http://impactfactor.cn/atr/?ISSN=BK0265693<br><br> <br><br>书目名称Dependability in Electronic Systems被引频次<br> http://impactfactor.cn/tc/?ISSN=BK0265693<br><br> <br><br>书目名称Dependability in Electronic Systems被引频次学科排名<br> http://impactfactor.cn/tcr/?ISSN=BK0265693<br><br> <br><br>书目名称Dependability in Electronic Systems年度引用<br> http://impactfactor.cn/ii/?ISSN=BK0265693<br><br> <br><br>书目名称Dependability in Electronic Systems年度引用学科排名<br> http://impactfactor.cn/iir/?ISSN=BK0265693<br><br> <br><br>书目名称Dependability in Electronic Systems读者反馈<br> http://impactfactor.cn/5y/?ISSN=BK0265693<br><br> <br><br>书目名称Dependability in Electronic Systems读者反馈学科排名<br> http://impactfactor.cn/5yr/?ISSN=BK0265693<br><br> <br><br>
Outmoded
发表于 2025-3-22 00:14:52
Durkheim and the Study of Suicidewitches, blockade, and interlocking systems in addition to traffic lights. It is still new in our memory that the computer systems for spaceship Apollo played a very important role in order to bring human being to the moon for the first time in history.
Militia
发表于 2025-3-22 04:15:10
http://reply.papertrans.cn/27/2657/265693/265693_3.png
跳动
发表于 2025-3-22 05:47:24
https://doi.org/10.1007/978-3-030-75158-6temperature instability (NBTI) , short-channel effect , gate leakage , and so on. Terrestrial neutron-induced single-event upset (SEU) is one of such key issues that can be a major setback in scaling.
Hypomania
发表于 2025-3-22 09:53:32
Durkheim and the Study of Suicides do. Electromagnetic compatibility (EMC) is defined as the ability of a device, equipment, or system to function satisfactorily in its electromagnetic environment without introducing intolerable electromagnetic disturbances to anything in that environment .
scotoma
发表于 2025-3-22 14:56:41
http://reply.papertrans.cn/27/2657/265693/265693_6.png
scotoma
发表于 2025-3-22 18:10:56
Terrestrial Neutron-Induced Failures in Semiconductor Devices and Relevant Systems and Their Mitigatemperature instability (NBTI) , short-channel effect , gate leakage , and so on. Terrestrial neutron-induced single-event upset (SEU) is one of such key issues that can be a major setback in scaling.
amnesia
发表于 2025-3-22 22:52:08
http://reply.papertrans.cn/27/2657/265693/265693_8.png
军火
发表于 2025-3-23 03:00:42
http://reply.papertrans.cn/27/2657/265693/265693_9.png
散布
发表于 2025-3-23 08:38:35
http://reply.papertrans.cn/27/2657/265693/265693_10.png