parasite
发表于 2025-3-25 06:16:35
http://reply.papertrans.cn/27/2648/264718/264718_21.png
Flinch
发表于 2025-3-25 10:07:53
http://reply.papertrans.cn/27/2648/264718/264718_22.png
花费
发表于 2025-3-25 11:51:50
http://reply.papertrans.cn/27/2648/264718/264718_23.png
ear-canal
发表于 2025-3-25 18:16:11
N.G. Stocks,A. Nikitin,R.P. MorseConsequently, models for yield analysis have been proposed for “large area clustering” and “small area clustering”. By adding a new parameter, the ., to the existing parameters of the defect distribution we unify the analysis of the existing models and at the same time add a whole range of “medium s
危险
发表于 2025-3-25 20:43:17
Preliminaries: Basics and Notation,irectly from the circuit layout provide yield estimates for each circuit piece. Such simulations predict that random point defects will cause less than 1% of the 1266-transistor switches to fail. Yield estimates for each circuit piece are used as inputs to a yield model to evaluate the fault toleran
移动
发表于 2025-3-26 03:38:14
Carsten Timmermann,Julie Anderson-out-of-n, k < n, unit group, called a block, is operated with k units being worked in the normal operation and the remaining (n-k) units being used as spares. The n switching parts in the block, instead of the traditional k ones, can also mask the faults in the switching part of the block. Under th
FLIRT
发表于 2025-3-26 08:22:07
Takahiro Ueyama,Christophe Lécuyerrchitectures are often used in highly dependable systems. However, these architectures have several drawbacks for onboard equipments: cost, weight, volume, power consumption and dissipation often lead to difficult problems. In other respects, if duplex architectures allow to reduce some of these pro
BRUNT
发表于 2025-3-26 09:01:18
Devices for Cardiac Resynchronization: to prevent a consistent reduction of the production yield and a short functioning life of devices. These problems become particularly important when the application is critical and maintenance is difficult or impossible. In the APES environment some tools are available to evaluate statistically the
作茧自缚
发表于 2025-3-26 13:46:47
https://doi.org/10.1007/978-981-13-0782-9 reconfigurable chips in which there are redundant elements that can be used to replace the defective elements. The fault covering problem is to assign redundant elements to replace the defective elements such that the chip will function properly. A general formulation to represent the relationship
Alopecia-Areata
发表于 2025-3-26 17:35:13
https://doi.org/10.1007/978-981-13-0782-9ith spare rows and columns. By studying the probability of successful application of these heuristics, we are able to make statements about their average performance. Finally, an algorithm which almost always runs in polynomial time based on an appropriate failure rate is presented.