无礼回复 发表于 2025-3-23 10:16:54

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缩短 发表于 2025-3-23 15:41:48

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裂隙 发表于 2025-3-23 19:32:53

https://doi.org/10.1007/978-3-662-24751-8 is completely compatible with standard silicon IC processing. It uses optical signals transmitted to the circuit for “inputting” the stimulus data and also uses optical signals from the circuit for observation of the logic output. In addition, this approach is fully compatible with the simultaneous

Graphite 发表于 2025-3-24 00:02:44

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Charlatan 发表于 2025-3-24 02:58:45

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战役 发表于 2025-3-24 08:19:22

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BIAS 发表于 2025-3-24 15:25:54

978-3-319-88819-4Springer International Publishing AG 2018

场所 发表于 2025-3-24 23:04:24

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密码 发表于 2025-3-25 01:21:40

Comparison of Contactless Testing Methodologies,ss testing methodologies that covered in this text and makes a comparison based on above properties. This will be valuable to readers as contactless probing is gaining more importance as fabrication technologies become smaller and more susceptible to the parasitic impact of mechanical probes.
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查看完整版本: Titlebook: Contactless VLSI Measurement and Testing Techniques; Selahattin Sayil Book 2018 Springer International Publishing AG 2018 Integrated Circu