insolence
发表于 2025-3-30 11:36:41
The Time-of-Flight Atom-Probe and Its Application to Surface Analysis and Gas-Surface Interactions,identity of these atoms can be determined. This high-voltage pulse atom-probe is very useful for the microanalysis of materials, especially for metals and alloys where field evaporation proceeds from plane edges, atom by atom. Thus, atomic layer by atomic layer compositional analysis can be carried
开始发作
发表于 2025-3-30 13:12:47
Field Emission Microscopy - Trends and Perspectives,f modest proportions) of activity. Optical microscopy generally was relegated to use as a test for surface smoothness by the metallographer in preparing a surface for subsequent surface study, or on a few occasions was used in an actual surface investigation. Electron microscopy was occasionally use
congenial
发表于 2025-3-30 20:16:53
Scanning Tunneling Microscopy,tion of the STM. The following section then deals with different applications and examples of surface microscopy. It also contains a brief look at other applications of the STM. In the fifth section we focus on spectroscopic data, i.e., results on the electronic structure of the surface. The conclus
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发表于 2025-3-30 23:43:02
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GUILE
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Predigest
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Flu表流动
发表于 2025-3-31 10:30:23
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DEMUR
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backdrop
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