不连贯 发表于 2025-3-23 12:47:04

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overreach 发表于 2025-3-23 17:15:20

https://doi.org/10.1007/978-3-642-58760-3anning. This problem is particularly relevant for the new class of synchrotron-radiation techniques known as . — which combine the analytical power of established spectroscopies with high lateral resolution. These techniques are becoming extremely important with the advent of the new, ultrabright

数量 发表于 2025-3-23 21:51:44

https://doi.org/10.1007/978-1-4612-4796-8es based on zone plate optics are utilized. One of these is an ultrahigh vacuum scanning photoemission microscope (SPEM) solely intended for surface characterization, while the other is a scanning transmission x-ray microscope (STXM). The former was substantially modified during the last few years a

单挑 发表于 2025-3-23 23:20:19

Charge Exchange Between Localized Sitespaper discusses mainly the present state of art of imaging with a multimethod instrument which allows LEED, LEEM, MEM and various emission microscopies without and with energy filtering, using electrons or photons as primary species. It includes also a brief comparison with spin-polarized LEEM and w

异端 发表于 2025-3-24 03:16:05

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两种语言 发表于 2025-3-24 08:04:01

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图画文字 发表于 2025-3-24 11:35:54

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眨眼 发表于 2025-3-24 17:07:50

https://doi.org/10.1007/978-94-011-5724-7LEEM; PEEM; PES; SNOM; STM; electron microscope; electron microscopy; microscopy; spectroscopy

judicial 发表于 2025-3-24 19:07:39

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松驰 发表于 2025-3-24 23:43:24

Recent Advances in LEEM/PEEM for Structural and Chemical Analysis,paper discusses mainly the present state of art of imaging with a multimethod instrument which allows LEED, LEEM, MEM and various emission microscopies without and with energy filtering, using electrons or photons as primary species. It includes also a brief comparison with spin-polarized LEEM and with pure emission microscopy.
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查看完整版本: Titlebook: Chemical, Structural and Electronic Analysis of Heterogeneous Surfaces on Nanometer Scale; Renzo Rosei Book 1997 Springer Science+Business